hot carriers meaning in English
热载子
Examples
- Stress - dependent hot carrier degradation for pmosfets structure under stress mode vg
2应力模式下应力相关的热载流子退化 - Under hot carrier stress , device degradation is the consequence of hot carrier induced defect generation locally at drain side
在热载流子应力条件下,器件的退化主要是由于在漏极附近由热载流子产生的损伤缺陷引起的。 - Similar to hot carrier degradation , asymmetric on - current recovery was also observed and discussed . device degradation behaviors are compared in low vd - stress and in high vd - stress condition
在自加热退化中我们也发现了类似热载流子退化中的非对称性恢复现象,并对其退化特点和模型进行了讨论。 - Device degradation behaviors of typical - sized n - type metal induced lateral crystallized polycrystalline silicon thin film transistors were investigated under two kinds of dc bias stresses : hot carrier stress and self - heating stress
本文主要研究了典型尺寸的n型金属诱导横向结晶多晶硅薄膜晶体管在两种常见的直流应力偏置下的退化现象:热载流子退化和自加热退化。 - Second , the hot carrier induced degradation in sde structures is deeply analyzed . the experiments results have shown that the degradation of sde structures shows different characteristics . the degradation nature is studied and an explanation is given
论文的重点是研究sdemos器件的热载流子可靠性，研究发现sdemos器件的退化特性与常规器件不同，通过实验与模拟相结合的方法，指出sdemos器件退化呈现出不同特点的内在原因，并给出了sdemos器件退化特性的物理解释。